Engstrom, James

Chemical Engineering

Research Interests: Gas-surface dynamics via molecular beam scattering. Inorganic-organic interfaces and molecular-based electronics. Atomic layer deposition. In-situ monitoring and control of thin film processes, including X-ray synchrotron radiation, X-ray photoelectron spectroscopy and low energy ion scattering spectrometry.

Email: jre7@cornell.edu
Phone: 607-255-9934
Website: http://www.cheme.cornell.edu/people/profile.cfm?netid=jre7